Publication

(in preparation)

Superconducting Qubit Fabrication by Using One-step All Electron Beam Lithography Lift-off Process
L. H. Lee, X. C. Lu, L. U. Liang, Z. Y. Chen, T. H. Lee, C. C. Chang, J. Y. Wang, C. S. Wu, C. D. Chen
(PDF)

Josephson Junction Chains as Microwave Detectors for Probing on-chip Resonators
W. C. Chien, L. H. Lee, C. D. Chen, C. S. Wu, Watson Kuo

Operating the Flux Driven JPA for Axion search (with National Center University)

Epitaxial Aluminum-on-Sapphire Films as a Superconducting Microwave Resonator for Parametric Amplification Application (with National Chunghua University of Education)

Surface Acoustic Waves Resonator Coupled to an Artificial Atom (with National Chunghua University of Education)

Journal articles

Plan-View Transmission Electron Microscopy Specimen Preparation for Atomic Layer Materials by Focused-Ion Beam
L. H. Lee, C. H. Yu, C. Y. Wei, P. C. Lee, J. S. Huang, C. Y. Wen
Ultramicroscopy, 2019. 197: p. 95-99. DOI: 10.1016/j.ultramic.2018.12.001

Grafting Methyl Groups on Si (111) Surface as a Buffer Layer for van der Waals Epitaxial Growth of ZnO Nanorods in Chemical Bath Deposition
C. H. Yu, L. H. Lee, K. H. Chen, C. Y. Wen
Journal of Physical Chemistry C, 2019. 123(51): p. 30981-30985. DOI: 10.1021/acs.jpcc.9b08207

Low-power Resistive Random Access Memory by Confining the Formation of Conducting Filaments
Y. J. Huang, T. H. Shen, L. H. Lee, C. Y. Wen, S. C. Lee
Aip Advances, 2016. 6(6). DOI: 10.1063/1.4954974

In-situ Scanning Electron Microscopy Observation of MoS2 Nanosheets during Lithiation in Lithium Ion Batteries
C. Y. Wei, P. C. Lee, C. W. Tsao, L. H. Lee, D. Y. Wang, C. Y. Wen
Acs Applied Energy Materials, 2020. 3(7): p. 7066-7072. DOI: 10.1021/acsaem.0c01102

Oral presentation

A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam
L. H. Lee, C. H. Yu, Y. T. Hong, C. Y. Wen
Microscopy and Microanalysis, 23(S1), 266-267. DOI: https://doi.org/10.1017/S143192761700201X

Poster presentation

Superconducting Qubit Fabrication by Using One-step All Electron Beam Lithography Process
L. H. Lee, T. H. Lee, Z. Y. Chen, X. C. Lu, L. U. Liang, C. C. Chang, C. S. Wu, C. D. Chen
International quantum computer workshop, Taiwan, 2020

A Plan-view TEM Specimen Preparation Method Using the Focused Ion Beam System
L. H. Lee, C. Y. Wen
Annual Conference of Microscopy Society of Taiwan, Taiwan, 2016

Kinetic Diffraction Simulation of Transmission Electron Microscopy
L. H. Lee, C. Y. Wen
Workshop on undergraduate research project, Taiwan, 2014

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